Theodoridis, Sergios; Koutroumbas, Konstantinos, Pattern Recognition, Elsevier Academic Press,
Oakland, John S, Statistical Process Control, Elsevier Butterworth-Heinemann,
D. C. Williams (edit.), Optical Methods in Engineering Metrology, Chapman & Hall,
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Theodoridis, Sergios; Koutroumbas, Konstantinos, Pattern Recognition, Elsevier Academic Press,